Centre for Innovative Manufacturing in Advanced Metrology
Creating the Next Generation of Measurement Technology
Welcome to the EPSRC Centre for Innovative Manufacturing in Advanced Metrology. The Centre is based at the University of Huddersfield’s Centre for Precision Technologies, a long-established group with an international reputation in precision engineering, and metrology research and development.
Our aim is to develop the UK’s manufacturing metrology capabilities and support economic growth in precision engineering.
We are working closely with industrial and academic partners to ensure that our research and projects will benefit the sector and ultimately lead to more efficient and accurate manufacturing processes.
EPSRC Centres are a new approach by Government and UK Research Councils to maximise the impact of innovative research for the UK, to support existing industries, and to open up new industries and markets in growth areas. Each EPSRC Centre will act as a national centre for research in its specific area and will work closely with industry partners to find solutions for their long-term manufacturing challenges.
EPSRC (Engineering and Physical Sciences Research Council) is the main UK government agency for funding research and training in engineering and the physical sciences.
This story published on Friday 21 November 2014
The University's EPSRC Centre for Innovative Manufacturing in Advanced Metrology wins the Manufacturing Technology category of the 2014 Innovation Awards by the Institution of Engineering and Technology (IET)
This story published on Monday 17 November 2014
A Wavelength Scanning Interferometer developed by Prof Jane Jiang has been shortlisted in the Manufacturing Technology category
This story published on Tuesday 28 October 2014
The University’s EPSRC Centre for Innovative Manufacturing in Advanced Metrology will host delegates from around the world
This story published on Tuesday 30 September 2014
John Song from the US National Institute of Standards and Technology talks about their ground-breaking Forensic Topography and Surface Metrology project
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