Dr Wenhan Zeng
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Dr Wenhan Zeng was appointed as a Senior Research Fellow in 2011 at the EPSRC IMRC in Advanced Metrology. He started his employment with the Centre for Precision Technologies within the University of Huddersfield as a Research Fellow from 2004.
Dr Wenhan Zeng received his BEng in mechanical engineering from Huazhong University of Science and Technology (Top 10 in overall and the best in Mechanical Engineering in China) in 1997, and received his MEng in Precision instrumentation at the same University in 2000. He finished his PhD in 2005 and his thesis entitled with “Dual Tree Complex Wavelet Based Surface Analysis Model and Topography Recognition for Machining Process” has been awarded as one of the best dissertations in HUST in 2005. In 2012, he was awarded the “High level Oversea’s Talent Young Scientist” by municipal government of Beijing, China.
Research & Scholarship
Dr Wenhan Zeng is an experienced researcher in the field of Surface metrology. As the nominated main researcher, he has finished 3 EPSRC funded project, 1 UoH funded project and several Industry funded project and has also involved in 1 ERC funded project. His research has been mainly focused on Precision Measurement, Surface metrology, and Instrumentation as well as the application of developing algorithms and software for precision metrology. Dr. Wenhan Zeng’ current research interest focuses on the precision metrology, including surface metrology and dimensional metrology, as well as the signal processing, image processing, pattern recognition, big data processing and data fusion from different sensors. His current work role in the EPSRC IMRC is to investigate and develop mathematical principles and algorithms for the measurement and evaluation of the high-precision products within the high-added value manufacture, especially for the fitting, filtration and characterization of freeform and structured surfaces.
Publications and Other Research Outputs
Lan, X., Jiang, X., Zeng, W. and Blunt, L. (2015) ‘Construct Surface Characterization System by Assembling Functional Components Dynamically’ Procedia CIRP , 27, pp. 198-201.
Lou, S., Jiang, X., Zeng, W. and Paul, S. (2015) ‘A theoretical insight into morphological operations in surface measurement by introducing the slope transform’ Journal of Zhejiang University Science A . ISSN 1673-565X
Li, T., Blunt, L., Jiang, X. and Zeng, W. (2013) ‘An Information Model for Surface Metrology’ Procedia CIRP , 10, pp. 251-258. ISSN 2212-8271
Zeng, W., Jiang, X., Scott, P. and Li, T. (2013) ‘A New Method to Characterize the Structured Tessellation Surface’ Procedia CIRP , 10, pp. 155-161. ISSN 2212-8271
Lou, S., Zeng, W., Jiang, X. and Scott, P. (2013) ‘Robust Filtration Techniques in Geometrical Metrology and Their Comparison’ International Journal of Automation and Computing , 10 (1), pp. 1-8. ISSN 1476-8186
Zeng, W., Jiang, X., Scott, P. and Blunt, L. (2012) ‘Diffusion filtration for the evaluation of MEMs surface’ International Journal of Precision Engineering and Manufacturing . ISSN 2234-7593
Zeng, W., Jiang, X. and Scott, P. (2011) ‘A Generalised Linear and Nonlinear Spline filter’ Wear , 271 (3/4), pp. 544-547. ISSN 0043-1648
Zeng, W., Jiang, X. and Scott, P. (2011) ‘Roundness filtration by using robust regression filter’ Measurement Science and Technology , 22 (3), p. 035108. ISSN 0957-0233
Zeng, W., Jiang, X. and Scott, P. (2010) ‘Fast algorithm of the Robust Gaussian Regression Filter for Areal Surface Analysis’ Measurement Science and Technology , 21 (5), p. 055108. ISSN 0957-0233
Zeng, W., Jiang, X., Smith, I. and Scott, P. (2010) ‘Transient Signal Separation in Watt Balance Experiments’ Physics Letters A , 374 (11-12), pp. 1301-1306. ISSN 0375-9601
Zeng, W., Jiang, X., Scott, P. and Blunt, L. (2008) ‘Investigation on the noise separation in watt balance experiments’ Key Engineering Materials , 381-382, pp. 619-622. ISSN 1013-9826
Jiang, X., Zeng, W., Scott, P. and Ma, J. (2008) ‘Linear feature extraction based on complex ridgelet transform’ Wear , 264 (5-6), pp. 428-433. ISSN 0043-1648
Jiang, X., Zeng, W., Smith, I., Scott, P. and Maletras, F. (2007) ‘The detection of transient behaviour in environmental vibration for the Watt balance’ Measurement Science and Technology , 18 (5), pp. 1487-1494. ISSN 0957-0233
Zeng, W., Jiang, X., Gao, Y. and Xie, T. (2005) ‘Texture extraction and identification of 3D engineering surfaces ’ Key Engineering Materials , 295-296, pp. 453-458. ISSN 1013-9826
Zeng, W., Jiang, X. and Scott, P. (2005) ‘Metrological characteristics of dual-tree complex wavelet transform for surface analysis’ Measurement Science and Technology , 16 (7), pp. 1410-1417. ISSN 0957-0233
Zeng, W., Jiang, X. and Scott, P. (2005) ‘Complex ridgelets for the extraction of morphological features on engineering surfaces’ Journal Paper of Physics: Conference Series , 13, pp. 246-249. ISSN 1742-6588
Lou, S., Zeng, W., Jiang, X. and Scott, P. (2012) ‘Comparison of Robust Filtration Techniques in Geometrical Metrology’. In: 18th International Conference on Automation and Computing (ICAC) 2012. Leicestershire, UK: IEEE. pp. 1-6. ISBN 978-1-4673-1722-1
Jiang, X., Zeng, W. and Scott, P. (2011) ‘Wavelet Analysis for the Extraction of Morphological Features for Orthopaedic Bearing Surfaces’. In: Progress in Molecular and Environmental Bioengineering - From Analysis and Modeling to Technology Applications. London: InTech. . ISBN 9789533072685
Zeng, W., Jiang, X., Scott, P., Xiao, S. and Blunt, L. (2009) ‘A Fast Algorithm for the High Order Linear and Nonlinear Gaussian Regression filter’. In: Proceedings of the 9 th international conference of the european society for precision engineering and nanotechnology. San Sebastian, Spain: euspen. pp. 356-359. ISBN 978-0-9553082-6-0
Lou, S., Jiang, X., Zeng, W., Abdul-Rahman, H. and Paul, S. (2015) ‘From planar surfaces based on lattices to freeform surfaces based on triangular meshes: an advanced extension of the areal motif method’. In: 15th International Conference on Metrology and Properties of Engineering Surfaces, 2-5 March 2015, Charlotte, North Carolina, USA
Lou, S., Jiang, X., Zeng, W. and Scott, P. (2014) ‘Slope transform: a theoretical insight into morphological operations in surface measurement’. In: 13th CIRP Conference on Computer Aided Tolerancing, 11-14 May 2014, Hangzhou, China
Zeng, W., Jiang, X. and Scott, P. (2009) ‘A Generalised Linear and Nonlinear Spline filter’. In: 12th International Conference on Metrology and Properties of Engineering Surfaces, 8-10 July 2009, Rzeszów, Poland
Blunt, L., Jiang, X., Zeng, W. and Asim, T. (2009) ‘A new way to evaluate steel sheet surfaces’. In: The 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), 29 June - 2 July 2009, Saint-Petersburg, Russia
Zeng, W., Jiang, X., Scott, P. and Blunt, L. (2009) ‘New Geometrical Filtratation For Ultra-Precision And Micro,Nano Manufactured Products’. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield
Zeng, W., Jiang, X., Scott, P. and Blunt, L. (2008) ‘Morphological Component Analysis based Detection of Transient Behaviour in Environmental Vibration for the Watt Balance’. In: 10th International Conference of the European Society for Precision Engineering and Nanotechnology, euspen, 18th-22nd May 2008, Kongresshaus Zurich
Zeng, W. and Jiang, X. (2005) ‘Complex wavelet transform based surface topography analysis’. In: 7th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM & Robotic Performance, Lamdamap 2005, 27th-30th June 2005, Cranfield University , pp. 304-313
Zeng, W., Jiang, X., Scott, P. and Blunt, L. (2005) ‘Metrological characteristics of complex wavelet transform for surface topography analysis’. In: 5th euspen International Conference, 9th-12th May 2005, Montpellier, France
Dr. Wenhan Zeng is a reviewer for the following journals: Journal of Engineering Manufacture, Journal of Computers, Measurement, Int. J. of Advanced Manufacturing Technology.
He is also a member of IEEE, EUSPEN and ASPE.
Research Degree Supervision
General areas of supervision:
- Freeform and structured surface Metrology
- Structured surface characterisation
- Signal processing
- Images processing
- Pattern recognition
- Data fusion
- Big data processing
- Please contact this member of staff to discuss possible opportunities.