Dr Feng Gaof.gao@hud.ac.uk | 01484 472769
Feng Gao is a Senior Research Fellow working within the Surface Metrology Group (SMG) of Centre for Precision Technologies (CPT). Feng Gao is a very experienced research scientist in the field of metrology and instrumentation. He received his B. Eng and M. Eng in precision test and instrumentation at Tianjin University in 1985 and 1988 respectively. He started his research career in the field of length metrology at National Institute of Metrology of China. During that period he involved in 7 research and development projects ranging from the establishment of the national standard in micro-displacement and related research projects to the development of a CMM in orthodontic application. The research project: “High precision determination of 633nm He-Ne Laser wavelength in air” won a Third Prize of National Invention Award of the State Science and Technology Commission of China 1995. In 1995 he started to work as a visiting scholar at PTB (Physikalisch-Techniche-Bundesanstalt, Braunschweig, Germany). In PTB he involved in the research of establishment of a calibration system for Scanning Probe Microscopes (SPMs). He moved to the UK in 1997 to pursuit his Ph.D. study in precision measurement and instrumentation at Coventry University. In 1999 he followed his supervisor moved to the University of Warwick. His Ph.D. project: “Development of a novel Multi-Function Tribological Nano-Probe Microscope” won a commendation award at the “Metrology for World Class Manufacturing Awards 2001” held by NPL and DTI. From 2001 he worked as a research associate at the Wolfson School of Mechanical and Manufacturing Engineering, Loughborough University. He involved in an EPSRC funded industry project: Fastener Load Measurement on High temperature Pressure Vessels and the research in the 3D surface measurement techniques in micro/nano-scales Scanning White-Light Interferometry. He has published 26 papers on measurement science and instrumentation. He is very experienced in the research and development of industrial measuring instruments, laser interferometry, coordinate measuring machine, Scanning Probe Microscopy and Scanning White Light Interferometry.
Research activities
Achievements
Muhamedsalih, H., Gao, F. and Jiang, X. (2012) ‘Comparison study of algorithms and accuracy in the wavelength scanning interferometry’ Applied Optics , 51 (36), pp. 8854-8862. ISSN 0003-6935
Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘In-Process Fast Surface Measurement Using Wavelength Scanning Interferometry’ Advanced Materials Research , 622-62, pp. 357-360. ISSN 1662-8985
Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘In-process fast surface measurement using wavelength scanning interferometry’. In: 2012 International Conference on Manufacturing and Optimization , September 15-16, 2012, Beijing, China
Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘Surface and thickness measurement of a transparent film using wavelength scanning interferometry’ Optics Express , 20 (19), p. 21450. ISSN 1094-4087
Muhamedsalih, H., Jiang, X. and Gao, F. (2012) ‘Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noise’ Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing . ISSN 1877-7058
Feng, G., Wang, X. and Jiang, X. (2012) ‘A Digital Phase-Lock Method for AOD Scanning Measurement System’ International Journal of Mechanic Systems Engineering , 2 (1), pp. 42-47. ISSN 2225-7403
Muhamedsalih, H., Jiang, X. and Gao, F. (2011) ‘Comparison of fast Fourier transform and convolution in wavelength scanning interferometry’. In: Proceedings of SPIE Volume 8082. : SPIE Optical Metrology. p. 80820Q-80820Q.
Muhamedsalih, H., Jiang, X. and Gao, F. (2011) ‘Acceleration computing process in wavelength scanning interferometry’. In: 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2011) , 29th June - 2nd July 2011, Daejeon, S. Korea
Gao, F., Jiang, X., Muhamedsalih, H. and Martin, H. (2011) ‘Wavelength scanning interferometry for measuring transparent films of the fusion targets’. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK , pp. 172-176
Gao, F., Jiang, X., Muhamedsalih, H. and Martin, H. (2011) ‘Wavelength scanning interferometry for measuring transparent films of the fusion targets’. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK , pp. 172-176
Muhamedsalih, H., Jiang, X. and Gao, F. (2010) ‘Vibration compensation of wavelength scanning interferometer for in-process surface inspection ’. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. Huddersfield: University of Huddersfield. pp. 148-153. ISBN 9781862180932
Gao, F., Jiang, X., Muhamedsalih, H. and Martin, H. (2010) ‘Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target’. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford
Jiang, X., Gao, F. and Wang, K. (2010) ‘Wavelength Scanning Interferometer for Structured Surfaces’. In: ASPE Summer Topical Meeting on Precision Interferometric Metrology, 23rd - 25th June 2010, Asheville, North Carolina, USA , pp. 11-15
Jiang, X., Gao, F. and Mateboer, A. (2010) ‘An approach of assessment for ultra-precision V-groove structured surfaces ’. In: Proceedings of the euspen International Conference – Delft - June 2010. Delft, Netherlands: European Society for Precision Engineering & Nanotechnology. .
Jiang, X., Wang, K., Gao, F. and Muhamedsalih, H. (2010) ‘Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise’ Applied Optics , 49 (15), pp. 2903-2909. ISSN 1559-128X
Muhamedsalih, H., Jiang, X. and Gao, F. (2009) ‘Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform.’. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. Huddersfield: University of Huddersfield. pp. 33-37. ISBN 9781862180857
Gao, F., Wang, K. and Jiang, X. (2009) ‘A high speed scanning heterodyne interferometer for in process surface measurement’. In: Proceedings of the euspen International Conference – San Sebastian - June 2009. San Sebastian, Spain: European Society for Precision Engineering & Nanotechnology. . ISBN 13:978-0-9553082-6-0
Gao, F., Jiang, X. and Blunt, L. (2009) ‘Automated ballistic and tool mark identification’. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield
Lobera, L., Gao, F., Petzing, J. and Coupland, J. (2008) ‘Limitations and Innovations in Scanning White Light Interferometry’. In: euspen 10th Anniversary International Conference, 18-22 May 2008 , Zurich, Switzerland, , pp. 287-291
Gao, F., Leach, R., Petzing, J. and Coupland, J. (2008) ‘Surface Measurement Errors using Commercial Scanning White Light Interferometers’ Measurement Science and Technology , 19 (1). ISSN 0957-0233
Gao, F., Petzing, J., Coupland, J. and Leach, R. (2007) ‘Measurement of structured surface using stylus, AFM and optical methods’. In: Metrology and properties of engineering surfaces: proceedings of the 11th international conference, Huddersfield, on 17th-20th July 2007. Huddersfield, UK: University of Huddersfield. p. 363. ISBN 1862180571
Gao, F., Coupland, J. and Petzing, J. (2006) ‘V-groove measurement with white light interferometry’. In: Photon06, 4-7 September, 2006, Manchester
Liu, X. and Gao, F. (2003) ‘A novel multi-function tribological probe microscope for mapping surface properties’ Measurement Science and Technology , 15 (1), pp. 91-102. ISSN 0957-0233
Liu, X., Bell, T., Gao, F. and Chetwynd, D. (2002) ‘Characterisation of engineered surfaces by a multi-function tribological probe microscope’. In: EUSPEN International Conference 2002. : EUSPEN. pp. 719-722.
Liu, X. and Gao, F. (2001) ‘Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope’. In: 2nd euspen International Conference, 27-31, May 2001, Turin, Italy , pp. 508-511
Gao, F. and Liu, X. (2000) ‘A multi-functional tribological probe microscope for surface and surface related properties’. In: The euspen nanotechnology workshop and Joint Warwick-Tokyo Nanotechnology Symposium, Sep. 2000, Warwick, UK
Gao, F. and Liu, X. (2000) ‘Development of a new multi-function tribological Microscope’. In: 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology and 2nd Annual General Meeting of euspen, 31 May - 2 June, 2000 , Copenhagen, Denmark , pp. 52-62
Gao, F., Peng, G. and Koenders, L. (1998) ‘Calibration of transfer standards for SPM’ Microelectronic Engineering , 41 (42), pp. 615-618. ISSN 0167-9317
Gao, F., Peng, G., Zhao, X. and Koenders, L. (1997) ‘Calibration of Standards and Application by SPM’. In: The 9th International Precision Engineering Seminar, May 1997, Braunschweig, Germany
Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) ‘Calibration of Standard Using a Scanning Probe Microscope’. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany , pp. 10-11
Gao, F (1993) ‘A Reflective Optic Fiber Displacement Sensor’. In: Young Scientists Symposium of National Institute of Metrology, 1993, Beijing, China , pp. 25-27
Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1993) ‘A Fabry—Perot Interferometer for Measuring Micro-Displacement’ ACTA Metrologica SINCA , 14 (2), pp. 94-98. ISSN 0894-0525
Gao, F. and Xu, Y. (1991) ‘The Study of a Fold Cavity Fabry-Perot Interferometer and it’s Phase’ Optoelectronic Engineering , 20 (3), pp. 18-20. ISSN 1003-501X
Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) ‘Precise Determination of 633nm He-Ne Laser Wavelength in Air’. In: 12th IMEKO World Congress Measurement and Progress DIGESE, 1990, Beijing, China , pp. 166-167
Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) ‘A High Precision Heterodyne Laser Interferometer for Measuring Micro-displacement’ ACTA Metrologica SINICA , 11 (1), pp. 32-35.
Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) ‘A High Precision Fold Fabry-Perot Interferometer for Measuring Displacement’. In: National Geometric Metrology Symposium, 1990, Qingdao, China , pp. 355-358
Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) ‘A Laser Heterodyne Interferometer for Measuring Air Refractive Index’. In: National Geometric Metrology Symposium, 1990, Qingdao, China , pp. 249-252
Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1989) ‘A Laser Heterodyne Interferometer for Measuring Nanometer Displacement’. In: 2nd IMEKO TC14 International Symposium on Metrology for Quality Control in Production, 1989, Beijing, China , pp. 286-289
Gao, F., Wang, B. and Zhuang, B. (1987) ‘A Projection Photoelectric 2D Positioning System’. In: National Symposium of Opto-Electronic technology, 1987, Jilin, China , pp. 93-95
