Portrait of Dr  Feng Gao Dr Feng Gao

f.gao@hud.ac.uk | 01484 472769



Biography

Feng Gao is a Senior Research Fellow working within the Surface Metrology Group (SMG) of Centre for Precision Technologies (CPT). Feng Gao is a very experienced research scientist in the field of metrology and instrumentation. He received his B. Eng and M. Eng in precision test and instrumentation at Tianjin University in 1985 and 1988 respectively. He started his research career in the field of length metrology at National Institute of Metrology of China. During that period he involved in 7 research and development projects ranging from the establishment of the national standard in micro-displacement and related research projects to the development of a CMM in orthodontic application. The research project: “High precision determination of 633nm He-Ne Laser wavelength in air” won a Third Prize of National Invention Award of the State Science and Technology Commission of China 1995. In 1995 he started to work as a visiting scholar at PTB (Physikalisch-Techniche-Bundesanstalt, Braunschweig, Germany). In PTB he involved in the research of establishment of a calibration system for Scanning Probe Microscopes (SPMs). He moved to the UK in 1997 to pursuit his Ph.D. study in precision measurement and instrumentation at Coventry University. In 1999 he followed his supervisor moved to the University of Warwick. His Ph.D. project: “Development of a novel Multi-Function Tribological Nano-Probe Microscope” won a commendation award at the “Metrology for World Class Manufacturing Awards 2001” held by NPL and DTI. From 2001 he worked as a research associate at the Wolfson School of Mechanical and Manufacturing Engineering, Loughborough University. He involved in an EPSRC funded industry project: Fastener Load Measurement on High temperature Pressure Vessels and the research in the 3D surface measurement techniques in micro/nano-scales Scanning White-Light Interferometry. He has published 26 papers on measurement science and instrumentation. He is very experienced in the research and development of industrial measuring instruments, laser interferometry, coordinate measuring machine, Scanning Probe Microscopy and Scanning White Light Interferometry.

Research & Scholarship

Research activities

  • On line and in process surface measurement by means of optical interferometry.
  • Contact and non-contact sensing technologies for high precision surface measurement.
  • Development of new measurement technologies and metrology methods.
  • Support to the measurement and calibration services provided by the CPT.

Achievements

  • Involved in over a dozen of research projects in the fields of precision measurement and instrumentation: responsible for mechanical design, optical design, electronic circuit design, experiment and test design, computer programming, data processing and analysing.
  • The Ph.D. project “Development of a novel multi-Function Tribological Nano-Probe Microscope” won a commendation award at the ‘Metrology for World Class Manufacturing Awards 2001’ held by NPL and DTI.
  • The project: The research of a ‘High precision determination of 633nm He-Ne Laser wavelength in air’ won a third prize of National Invention Award of the State Science and Technology Commission of China in 1995.

Publications and Other Research Outputs

2013

Tang, D., Gao, F. and Jiang, X. (2013) ‘Spectral Domain Low- Coherence Interferometry for On-line Surface Inspection’. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. Huddersfield: University of Huddersfield. pp. 194-199. ISBN 9781862181212

Ren, H., Jiang, X. and Gao, F. (2013) ‘Simulation of Tri-sensor Deflectometry for Freeform and Structured Specular Surfaces’. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. Huddersfield: University of Huddersfield. p. 236. ISBN 9781862181212

Gao, F., Tang, D. and Jiang, X. (2013) ‘White Light Spetral Interferometry for Real Time Surface Profile Measurement’. In: ASPEN 2013, 12-15, November 2013, Taipei, Taiwan , p. 53

Zhang, Z., Huang, S., Meng, S., Gao, F. and Jiang, X. (2013) ‘A simple, flexible and automatic 3D calibration method for a phase calculation-based fringe projection imaging systemOptics Express , 21 (10), p. 12218. ISSN 1094-4087

Liang, B., Iwnicki, S., Gao, F., Ball, A., Tran, V. and Cattley, R. (2013) ‘Railway Wheel Flat and Rail Surface Defect Detection by Time-frequency AnalysisChemical Engineering Transactions , 33, pp. 745-750. ISSN 1974-9791

2012

Muhamedsalih, H., Gao, F. and Jiang, X. (2012) ‘Comparison study of algorithms and accuracy in the wavelength scanning interferometryApplied Optics , 51 (36), pp. 8854-8862. ISSN 0003-6935

Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘In-Process Fast Surface Measurement Using Wavelength Scanning InterferometryAdvanced Materials Research , 622-62, pp. 357-360. ISSN 1662-8985

Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘In-process fast surface measurement using wavelength scanning interferometry’. In: 2012 International Conference on Manufacturing and Optimization , September 15-16, 2012, Beijing, China

Gao, F., Muhamedsalih, H. and Jiang, X. (2012) ‘Surface and thickness measurement of a transparent film using wavelength scanning interferometryOptics Express , 20 (19), p. 21450. ISSN 1094-4087

Muhamedsalih, H., Jiang, X. and Gao, F. (2012) ‘Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noiseProcedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing . ISSN 1877-7058

Feng, G., Wang, X. and Jiang, X. (2012) ‘A Digital Phase-Lock Method for AOD Scanning Measurement SystemInternational Journal of Mechanic Systems Engineering , 2 (1), pp. 42-47. ISSN 2225-7403

2011

Muhamedsalih, H., Jiang, X. and Gao, F. (2011) ‘Comparison of fast Fourier transform and convolution in wavelength scanning interferometry’. In: Proceedings of SPIE Volume 8082. : SPIE Optical Metrology. p. 80820Q-80820Q.

Muhamedsalih, H., Jiang, X. and Gao, F. (2011) ‘Acceleration computing process in wavelength scanning interferometry’. In: 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2011) , 29th June - 2nd July 2011, Daejeon, S. Korea

Gao, F., Jiang, X., Muhamedsalih, H. and Martin, H. (2011) ‘Wavelength scanning interferometry for measuring transparent films of the fusion targets’. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK , pp. 172-176

Gao, F., Jiang, X., Muhamedsalih, H. and Martin, H. (2011) ‘Wavelength scanning interferometry for measuring transparent films of the fusion targets’. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK , pp. 172-176

2010

Muhamedsalih, H., Jiang, X. and Gao, F. (2010) ‘Vibration compensation of wavelength scanning interferometer for in-process surface inspection ’. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. Huddersfield: University of Huddersfield. pp. 148-153. ISBN 9781862180932

Gao, F., Jiang, X., Muhamedsalih, H. and Martin, H. (2010) ‘Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target’. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford

Jiang, X., Gao, F. and Wang, K. (2010) ‘Wavelength Scanning Interferometer for Structured Surfaces’. In: ASPE Summer Topical Meeting on Precision Interferometric Metrology, 23rd - 25th June 2010, Asheville, North Carolina, USA , pp. 11-15

Jiang, X., Gao, F. and Mateboer, A. (2010) ‘An approach of assessment for ultra-precision V-groove structured surfaces ’. In: Proceedings of the euspen International Conference – Delft - June 2010. Delft, Netherlands: European Society for Precision Engineering & Nanotechnology. .

Jiang, X., Wang, K., Gao, F. and Muhamedsalih, H. (2010) ‘Fast surface measurement using wavelength scanning interferometry with compensation of environmental noiseApplied Optics , 49 (15), pp. 2903-2909. ISSN 1559-128X

2009

Muhamedsalih, H., Jiang, X. and Gao, F. (2009) ‘Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform.’. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. Huddersfield: University of Huddersfield. pp. 33-37. ISBN 9781862180857

Gao, F., Wang, K. and Jiang, X. (2009) ‘A high speed scanning heterodyne interferometer for in process surface measurement’. In: Proceedings of the euspen International Conference – San Sebastian - June 2009. San Sebastian, Spain: European Society for Precision Engineering & Nanotechnology. . ISBN 13:978-0-9553082-6-0

Gao, F., Jiang, X. and Blunt, L. (2009) ‘Automated ballistic and tool mark identification’. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield

2008

Lobera, L., Gao, F., Petzing, J. and Coupland, J. (2008) ‘Limitations and Innovations in Scanning White Light Interferometry’. In: euspen 10th Anniversary International Conference, 18-22 May 2008 , Zurich, Switzerland, , pp. 287-291

Gao, F., Leach, R., Petzing, J. and Coupland, J. (2008) ‘Surface Measurement Errors using Commercial Scanning White Light InterferometersMeasurement Science and Technology , 19 (1), p. 015303. ISSN 0957-0233

2007

Gao, F., Petzing, J., Coupland, J. and Leach, R. (2007) ‘Measurement of structured surface using stylus, AFM and optical methods’. In: Metrology and properties of engineering surfaces: proceedings of the 11th international conference, Huddersfield, on 17th-20th July 2007. Huddersfield, UK: University of Huddersfield. p. 363. ISBN 1862180571

2006

Gao, F., Coupland, J. and Petzing, J. (2006) ‘V-groove measurement with white light interferometry’. In: Photon06, 4-7 September, 2006, Manchester

2003

Liu, X. and Gao, F. (2003) ‘A novel multi-function tribological probe microscope for mapping surface propertiesMeasurement Science and Technology , 15 (1), pp. 91-102. ISSN 0957-0233

2002

Liu, X., Bell, T., Gao, F. and Chetwynd, D. (2002) ‘Characterisation of engineered surfaces by a multi-function tribological probe microscope’. In: EUSPEN International Conference 2002. : EUSPEN. pp. 719-722.

2001

Liu, X. and Gao, F. (2001) ‘Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope’. In: 2nd euspen International Conference, 27-31, May 2001, Turin, Italy , pp. 508-511

2000

Gao, F. and Liu, X. (2000) ‘A multi-functional tribological probe microscope for surface and surface related properties’. In: The euspen nanotechnology workshop and Joint Warwick-Tokyo Nanotechnology Symposium, Sep. 2000, Warwick, UK

Gao, F. and Liu, X. (2000) ‘Development of a new multi-function tribological Microscope’. In: 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology and 2nd Annual General Meeting of euspen, 31 May - 2 June, 2000 , Copenhagen, Denmark , pp. 52-62

1998

Gao, F., Peng, G. and Koenders, L. (1998) ‘Calibration of transfer standards for SPMMicroelectronic Engineering , 41 (42), pp. 615-618. ISSN 0167-9317

1997

Gao, F., Peng, G., Zhao, X. and Koenders, L. (1997) ‘Calibration of Standards and Application by SPM’. In: The 9th International Precision Engineering Seminar, May 1997, Braunschweig, Germany

Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) ‘Calibration of Standard Using a Scanning Probe Microscope’. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany , pp. 10-11

1993

Gao, F (1993) ‘A Reflective Optic Fiber Displacement Sensor’. In: Young Scientists Symposium of National Institute of Metrology, 1993, Beijing, China , pp. 25-27

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1993) ‘A Fabry—Perot Interferometer for Measuring Micro-DisplacementACTA Metrologica SINCA , 14 (2), pp. 94-98. ISSN 0894-0525

1991

Gao, F. and Xu, Y. (1991) ‘The Study of a Fold Cavity Fabry-Perot Interferometer and it’s PhaseOptoelectronic Engineering , 20 (3), pp. 18-20. ISSN 1003-501X

1990

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) ‘Precise Determination of 633nm He-Ne Laser Wavelength in Air’. In: 12th IMEKO World Congress Measurement and Progress DIGESE, 1990, Beijing, China , pp. 166-167

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) ‘A High Precision Heterodyne Laser Interferometer for Measuring Micro-displacementACTA Metrologica SINICA , 11 (1), pp. 32-35.

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) ‘A High Precision Fold Fabry-Perot Interferometer for Measuring Displacement’. In: National Geometric Metrology Symposium, 1990, Qingdao, China , pp. 355-358

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) ‘A Laser Heterodyne Interferometer for Measuring Air Refractive Index’. In: National Geometric Metrology Symposium, 1990, Qingdao, China , pp. 249-252

1989

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1989) ‘A Laser Heterodyne Interferometer for Measuring Nanometer Displacement’. In: 2nd IMEKO TC14 International Symposium on Metrology for Quality Control in Production, 1989, Beijing, China , pp. 286-289

1987

Gao, F., Wang, B. and Zhuang, B. (1987) ‘A Projection Photoelectric 2D Positioning System’. In: National Symposium of Opto-Electronic technology, 1987, Jilin, China , pp. 93-95

Research Degree Supervision

Available projects

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